Extending the Applicability Range of Compressive Sensing‐Based Microwave Imaging to Arbitrary Scatterers

Anselmi, N. and Oliveri, G. and Hannan, M. and Salucci, M. and Massa, A. (2017) Extending the Applicability Range of Compressive Sensing‐Based Microwave Imaging to Arbitrary Scatterers. Technical Report. ELEDIA Research Center - University of Trento.

[img]
Preview
Text
Extending the Applicability Range of Compressive Sensing‐Based Microwave Imaging to Arbitrary Scatterers.pdf

Download (4MB) | Preview

Abstract

This work deals with an innovative two-dimensional (2D) free-space microwave imaging technique. The developed inverse scattering (IS) technique is aimed at enabling Compressive Sensing (CS) to deal with the retrieval of unknown scatterers which are not necessarily sparse in the standard sense, i.e., in the pixel domain. Accordingly, the proposed technique exploits a user-defined dictionary of expansion bases that are used to retrieve several guesses of the electromagnetic properties of the investigation domain. Then, following the BCS paradigm, the sparsest solution is recognized as the optimal one. Some numerical results are presented, in order to verify the effectiveness of the proposed IS technique for imaging scatterers with arbitrary size and shape.

Item Type: Monograph (Technical Report)
Uncontrolled Keywords: Inverse Scattering (IS), Bayesian Compressive Sensing (BCS), Microwave Imaging, First Order Born Approximation
Subjects: A Areas > A WC Next Generation Wireless Communications
M Methodologies > M CS Compressive Sensing
URI: http://www.eledia.org/students-reports/id/eprint/743

Actions (login required)

View Item View Item