{"id":12556,"date":"2024-08-28T16:45:08","date_gmt":"2024-08-28T14:45:08","guid":{"rendered":"https:\/\/www.eledia.org\/eledia-unitn\/?post_type=news&#038;p=12556"},"modified":"2025-01-17T11:34:37","modified_gmt":"2025-01-17T10:34:37","slug":"new-eledia-paper-published-in-the-ieee-open-journal-of-instrumentation-and-measurement","status":"publish","type":"news","link":"https:\/\/www.eledia.org\/eledia-unitn\/news\/new-eledia-paper-published-in-the-ieee-open-journal-of-instrumentation-and-measurement\/","title":{"rendered":"New ELEDIA Paper Published in the IEEE Open Journal of Instrumentation and Measurement"},"content":{"rendered":"\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"1024\" src=\"https:\/\/www.eledia.org\/eledia-unitn\/wp-content\/uploads\/2024\/08\/2024-08-22.ELEDIA.Linkedin-Post.R394-1024x1024.png\" alt=\"\" class=\"wp-image-12557\" srcset=\"https:\/\/www.eledia.org\/eledia-unitn\/wp-content\/uploads\/2024\/08\/2024-08-22.ELEDIA.Linkedin-Post.R394-1024x1024.png 1024w, https:\/\/www.eledia.org\/eledia-unitn\/wp-content\/uploads\/2024\/08\/2024-08-22.ELEDIA.Linkedin-Post.R394-300x300.png 300w, https:\/\/www.eledia.org\/eledia-unitn\/wp-content\/uploads\/2024\/08\/2024-08-22.ELEDIA.Linkedin-Post.R394-150x150.png 150w, https:\/\/www.eledia.org\/eledia-unitn\/wp-content\/uploads\/2024\/08\/2024-08-22.ELEDIA.Linkedin-Post.R394-768x768.png 768w, https:\/\/www.eledia.org\/eledia-unitn\/wp-content\/uploads\/2024\/08\/2024-08-22.ELEDIA.Linkedin-Post.R394.png 1440w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<p>The <a href=\"https:\/\/www.linkedin.com\/company\/eledianet\/\" rel=\"noopener\">ELEDIA Research Center<\/a> is pleased to announce that a new paper has been published in the IEEE Open Journal of Instrumentation and Measurement:<br><br>M. Salucci, L. Poli, G. Gottardi, G. Oliveri, L. Tosi and A. Massa, &#8220;Microwave NDT\/NDE Through Differential Bayesian Compressive Sensing,&#8221; in IEEE Open Journal of Instrumentation and Measurement, vol. 3, pp. 1-15, 2024, Art no. 4500215, doi: 10.1109\/OJIM.2024.3412205.<br><br>The paper can be downloaded at the following link: <a href=\"https:\/\/ieeexplore.ieee.org\/document\/10552809\" rel=\"noopener\">https:\/\/ieeexplore.ieee.org\/document\/10552809<\/a><\/p>\n","protected":false},"author":1,"featured_media":12557,"template":"","format":"standard","meta":{"footnotes":""},"tags":[339],"news_status":[],"news_topic":[91],"class_list":["post","post-type","post-12556","news","type-news","status-publish","format-standard","has-post-thumbnail","hentry","tag-eledia-2","news_topic-news-publications",""],"acf":[],"_links":{"self":[{"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/news\/12556","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/news"}],"about":[{"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/types\/news"}],"author":[{"embeddable":true,"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/users\/1"}],"version-history":[{"count":3,"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/news\/12556\/revisions"}],"predecessor-version":[{"id":13636,"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/news\/12556\/revisions\/13636"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/media\/12557"}],"wp:attachment":[{"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/media?parent=12556"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/tags?post=12556"},{"taxonomy":"news_status","embeddable":true,"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/news_status?post=12556"},{"taxonomy":"news_topic","embeddable":true,"href":"https:\/\/www.eledia.org\/eledia-unitn\/wp-json\/wp\/v2\/news_topic?post=12556"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}