The ELEDIA Research Center is pleased to share the active participation of its students from the ELEDIA@BIT node, coordinated by Prof. Xiuzhu YE, at the 2026 IEEE International Conference on Computational Electromagnetics (ICCEM), held on April 10–12 in Shanghai, China.
On April 10, 2026, Master’s student Tingyu LI delivered an oral presentation titled “Uncertainty-Guided Evidential Deep Learning Schemes in Full-Wave Inverse Scattering Problems,” addressing advanced deep learning methodologies for reliable inverse electromagnetic analysis.
On the same day, Master’s student Yuanchen JI presented “Wideband Millimeter-Wave Short-Range Imaging: A K-space Spectral Integration Approach and Comparative Analysis,” focusing on innovative techniques for high-resolution millimeter-wave imaging systems.
These contributions highlight the strong scientific engagement of the ELEDIA@BIT students and their role in advancing cutting-edge research within the international electromagnetics community.
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