?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rft.relation=http%3A%2F%2Fwww.eledia.org%2Fstudents-reports%2F301%2F&rft.title=Determination+of+the+complex+permittivity+values+of+planar+dielectric+substrates+by+means+of+a+multifrequency+PSO-based+technique&rft.creator=Azaro%2C+Renzo&rft.creator=Caramanica%2C+Federico&rft.creator=Oliveri%2C+Giacomo&rft.subject=TU+Technical+Reports+and+Publications&rft.description=In+this+paper%2C+an+innovative+technique+for+the+determination+of+the+dielectric+properties+of+planar+substrates+is+presented.+Starting+from+a+set+of+impedance+measurements+performed+on+a+section+of+a+microstrip+transmission+line+built+on+the+planar+dielectric+substrate+under+test%2C+the+proposed+technique+formulates+the+reconstruction+problem+in+terms+of+an+optimization+one+successively+solved+by+means+of+an+effective+stochastic+algorithm.+Such+a+method+allows+one+the+reconstruction+of+the+permittivity+values+at+multiple+frequencies+by+simply+using+a+vector+network+analyzer+and+a+standard+calibration+procedure+for+the+impedance+measurement.+The+results+of+some+representative+experimental+tests+are+shown+for+a+preliminary+assessment+of+the+effectiveness+of+the+proposed+approach.+(c)+The+Electromagnetics+Academy+-+The+final+version+of+this+article+is+available+at+the+url+of+the+journal+PIER+M%3A+http%3A%2F%2Fwww.jpier.org%2FPIERM%2Fpier.php%3Fpaper%3D09112901&rft.publisher=University+of+Trento&rft.date=2010-01&rft.type=Monograph&rft.type=PeerReviewed&rft.format=text&rft.language=en&rft.identifier=http%3A%2F%2Fwww.eledia.org%2Fstudents-reports%2F301%2F1%2FDISI-11-023-OR10.pdf&rft.identifier=++Azaro%2C+Renzo+and+Caramanica%2C+Federico+and+Oliveri%2C+Giacomo++(2010)+Determination+of+the+complex+permittivity+values+of+planar+dielectric+substrates+by+means+of+a+multifrequency+PSO-based+technique.++Technical+Report.+University+of+Trento.+++++